Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

• Jeremiah Croshaw,
• Thomas Dienel,
• Taleana Huff and
• Robert Wolkow

Beilstein J. Nanotechnol. 2020, 11, 1346–1360, doi:10.3762/bjnano.11.119

• asymmetry between the profiles on the left and right of the missing dimers in both cases is a result of a slight tip asymmetry. The two raised Si species in Figure 3m,n (SiH3) and Figure 3o,p (SiH2) present an extra challenge to analyse, as they must be imaged with a larger tip–sample separation to prevent

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

• Mehmet Z. Baykara,
• Omur E. Dagdeviren,
• Todd C. Schwendemann,
• Harry Mönig,
• Eric I. Altman and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73

• spectroscopy; NC-AFM; three-dimensional atomic force microscopy; tip asymmetry; tip elasticity; Introduction Experimentally obtained information about atomic-scale interactions of specific surfaces with atoms, molecules, and other surfaces in their vicinity is crucial for a number of important scientific

• characteristic image features compared to the true structure and location of the surface sites that induce them; elastic deformations of the probe tip can cause a lateral shift of features in data acquired at different heights; and tip asymmetry effects may further complicate the assignment of characteristic

• be ignored for all practical purposes. Deformations due to (ii), on the other hand, may be largely compensated by employing the post-data-acquisition correction procedures described earlier for the layer-by-layer approach [11]. Tip asymmetry Even though imaging artifacts observed in atomic-scale